Prober 300mm (IAF-09.3) - PR971253-2050-P
2 pieces: Prober 300mm For the automated characterization of circuits in the millimetre wave range up to approx. 250 GHz by means of S-parameter and power measurements, two wafer probers are required that meet the highest requirements for positioning accuracy. Contact areas ("pads") of approx. 10µm must be able to be a...
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2 pieces: Prober 300mm For the automated characterization of circuits in the millimetre wave range up to approx. 250 GHz by means of S-parameter and power measurements, two wafer probers are required that meet the highest requirements for positioning accuracy. Contact areas ("pads") of approx. 10µm must be able to be approached precise...
- Ausschreibungstyp: Ausschreibung
- Auftraggeber: Fraunhofer-Gesellschaft - Einkauf B12
- Veröffentlicht: 20. April 2026
- Frist: Nicht angegeben
Ausschreibungsbeschreibung
2 pieces: Prober 300mm For the automated characterization of circuits in the millimetre wave range up to approx. 250 GHz by means of S-parameter and power measurements, two wafer probers are required that meet the highest requirements for positioning accuracy. Contact areas ("pads") of approx. 10µm must be able to be approached precisely and with high reproducibility over a "wafer" area of ø300 mm. As the height of these wafers can vary by approx. ±10µm, automatic height correction (Z-profiling) is required. Temperature control of the chuck is necessary.
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