Probe-station for 2.5D/3D memory device testing (IPMS-CNT01.1) - PR1035458-2480-P
1 Stück - Probe-station for 2.5D/3D memory device testing Optionen: LV Pos. 12 System configuration - active chuch cooling LV Pos. 13 System configuration - low temparature measurements LV Pos. 23 System configuration - temporary electric discharge of the chuck LV Pos. 31 System configuration - fixture for 6" std. rect...
Angebotsfrist:11. März 2026(abgelaufen)
Typ:Ausschreibung