Inline automatic optical inspection (AOI) with high-speed Analysis for QMI systems
Modular, fully automated prober for optical inspection and electrical contact of electronic, photonic and mi-cro‑mechanical devices — including advanced manufacturing approaches such as quasi‑monolithic integration. The system handles 200 mm wafers as well as frames, tapes, trays and comparable substrates. An end‑to‑en...
Angebotsfrist:11. März 2026(abgelaufen)
Typ:Ausschreibung